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DTSTAMP:20240214T070241Z
LOCATION:Darling Harbour Theatre\, Level 2 (Convention Centre)
DTSTART;TZID=Australia/Melbourne:20231212T093000
DTEND;TZID=Australia/Melbourne:20231212T124500
UID:siggraphasia_SIGGRAPH Asia 2023_sess209_papers_574@linklings.com
SUMMARY:Multiple-bounce Smith Microfacet BRDFs using the Invariance Princi
 ple
DESCRIPTION:Technical Papers\n\nYuang Cui (Anhui Science and Technology Un
 iversity); Gaole Pan and Jian Yang (Nanjing University of Science and Tech
 nology); Lei Zhang (The Hong Kong Polytechnic University); Ling-Qi Yan (Un
 iversity of California, University of California Santa Barbara); and Beibe
 i Wang (Nankai University, Nanjing University of Science and Technology)\n
 \nSmith microfacet models are widely used in computer graphics to represen
 t materials. Traditional microfacet models do not consider the multiple bo
 unces on microgeometries, leading to visible energy missing, especially on
  rough surfaces. Later, as the equivalence between the microfacets and vol
 ume has been revealed, random walk solutions have been proposed to introdu
 ce multiple bounces, but at the cost of high variance. Recently, the posit
 ion-free property has been introduced into the multiple-bounce model, resu
 lting in much less noise, but also bias or a complex derivation. In this p
 aper, we propose a simple way to derive the multiple-bounce Smith microfac
 et bidirectional reflectance distribution functions (BRDFs) using the inva
 riance principle. At the core of our model is a shadowing-masking function
  for a path consisting of direction collections, rather than separated bou
 nces. Our model ensures unbiasedness and can produce less noise compared t
 o the previous work with equal time, thanks to the simple formulation. Fur
 thermore, we also propose a novel probability density function (PDF) for B
 RDF multiple importance sampling, which has a better match with the multip
 le-bounce BRDFs, producing less noise than previous naive approximations.\
 n\nRegistration Category: Full Access, Enhanced Access, Trade Exhibitor, E
 xperience Hall Exhibitor
URL:https://asia.siggraph.org/2023/full-program?id=papers_574&sess=sess209
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