BEGIN:VCALENDAR
VERSION:2.0
PRODID:Linklings LLC
BEGIN:VTIMEZONE
TZID:Australia/Melbourne
X-LIC-LOCATION:Australia/Melbourne
BEGIN:DAYLIGHT
TZOFFSETFROM:+1000
TZOFFSETTO:+1100
TZNAME:AEDT
DTSTART:19721003T020000
RRULE:FREQ=YEARLY;BYMONTH=4;BYDAY=1SU
END:DAYLIGHT
BEGIN:STANDARD
DTSTART:19721003T020000
TZOFFSETFROM:+1100
TZOFFSETTO:+1000
TZNAME:AEST
RRULE:FREQ=YEARLY;BYMONTH=10;BYDAY=1SU
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20240214T070245Z
LOCATION:Meeting Room C4.8\, Level 4 (Convention Centre)
DTSTART;TZID=Australia/Melbourne:20231213T165000
DTEND;TZID=Australia/Melbourne:20231213T165800
UID:siggraphasia_SIGGRAPH Asia 2023_sess146_tcom_123@linklings.com
SUMMARY:Bounded VNDF Sampling for Smith–GGX Reflections
DESCRIPTION:Technical Communications, Technical Papers\n\nKenta Eto and Yu
 suke Tokuyoshi (Advanced Micro Devices, Inc.)\n\nThis paper presents an un
 biased VNDF sampling method specialized for reflections. By using our meth
 od, we can reduce the variance for rough surfaces with small overhead.\n\n
 Registration Category: Full Access\n\nSession Chair: Hongzhi Wu (Zhejiang 
 University; State Key Lab of CAD and CG, Zhejiang University)
URL:https://asia.siggraph.org/2023/full-program?id=tcom_123&sess=sess146
END:VEVENT
END:VCALENDAR