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DTSTART:19721003T020000
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DTSTAMP:20260114T163651Z
LOCATION:Meeting Room C4.8\, Level 4 (Convention Centre)
DTSTART;TZID=Australia/Melbourne:20231213T165000
DTEND;TZID=Australia/Melbourne:20231213T165800
UID:siggraphasia_SIGGRAPH Asia 2023_sess146_tcom_123@linklings.com
SUMMARY:Bounded VNDF Sampling for Smith–GGX Reflections
DESCRIPTION:Kenta Eto and Yusuke Tokuyoshi (Advanced Micro Devices, Inc.)\
 n\nThis paper presents an unbiased VNDF sampling method specialized for re
 flections. By using our method, we can reduce the variance for rough surfa
 ces with small overhead.\n\nRegistration Category: Full Access\n\nSession 
 Chair: Hongzhi Wu (Zhejiang University; State Key Laboratory of CAD&CG, Zh
 ejiang University)\n\n
URL:https://asia.siggraph.org/2023/full-program?id=tcom_123&sess=sess146
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